This paper reports experiences with a flat panel detector which replaces conventional X-ray imaging systems. An amorphous silicon array detector is used within a fully automated X-ray inspection unit designed for non destructive testing of aluminum components for the automotive industry. The new technology enables YXLON to considerably reduce the number of necessary views (and thus the cycle time) for complete coverage of the inspected part.
Publication Source: International Symposium on Computerized Tomography for Industrial Applications and Image Processing in Radiology March, 15 - 17, 1999 Berlin, Germany. Proceedings BB 67-CD. Publisher:DGZfP - German Society of Non-Destructive Testing
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