NDTnet 1998 Aug, Vol.3 No.8

Abstract

When the ARIANE 5 takes off for the outer space ,it will feature high-performance products and technologies . This include the BOOSTER cases, the SPLETRA Structur and the Composite/Steel high pressure Vessels used to swivel the booster nozzels .
The Pressure Vessels are used as energy storage elements for the control mechanisms of thecentral stage engine ( GAM - Group d'Activation Moteur ) and the booster stage nozzles (GAT- Groupe d'Activation Tuyere ) . These cylindrical pressure Vessels, are filled withhelium and hydraulic oil, are 433mm dia. and 4361mm long . Built for operating pressures of 450 bar. Tanks are copomposite designed of a Steel Liner wrapped with CFRP. The objectives of the AE survey are to monitor and qualify the AE Sources in order to charcaterise the AE signature, zones of most intensive stresses and damage ( if there is any) ofthe pressure tanks during different test configurations for using AE as a QS production test .Control tool .

The collected AE-database are from 1 GAT -, 1 GAM Qualification Vessel . AE - Test where carried out during Prestreching -, Proof-, 3 Lifecycle - followed by the Burstest of this Qualification Vessels.
The GAT Vessel began to be unstable over 997bar, first discovered by AE . Calculated burst pressure was 900bar . The main demage starts at 1019bar . The Vessel fails in the same region where the most active AE Sources where discovered, 8 months before, during the Prestreching- and Prooftest .This pre AE-database where used for comparision of the AE-results during prestreching and prooftest of 20 Production GAT - Vessels .All tested production Vessels shows a similar AE behaviour but also equal mechanical measurement results. AE can be used for QS production Control of this high performance CFRP/Steel Composite pressure Vessels.

Abstract Source:
Book of Abstracts, 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN: 87-986898-0-00

Full-Text Source:
Proceedings of the 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN:

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