NDTnet 1998 Aug, Vol.3 No.8

Abstract

The microelectronic sensors were originally developed for building leak detection systems with low power consumption and fast response. The information channel works out at one-chipped base with semiconductor sensitive element. The used algoritms make provide reliability test results. This structure allows to develope the distributed automatic leak testing systems. [Figure 1] Runtime detection of potential dangerous technological medias in industrial plants is important problem.

Figure 1. Automation system of leak detection

Diminutireness (lsm³), low power consumimg (<1W), high sensitivites (1ppm), fast response (1s) and low cost (200$ by channel) allow to mount sensors of this type closely to potential dangerous technological communications (stuffing-boxes, flanges and etc.). These systems provide high alarms and gas leakeges localization with sufficient accuracy. There is anumber of basic problems on the way of monitoring systems introduction, suchas:

• automatic tuning out of "null-zone";
• automatic compensation of sensors degradation;
• work relalbility control and sensor operating modes maintainance under conditions of high gas concentration;
• sensors and interface schemes protection from aggressive medias influence.

The research of different structure (resistive, MOS-structure and gas-sensitive Schottky barter diodes) semiconductor detectors provide them to be effective in construction of distributed monitoring systems of industrial zone.

Abstract Source:
Book of Abstracts, 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN: 87-986898-0-00

Full-Text Source:
Proceedings of the 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN:

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