NDTnet 1998 Aug, Vol.3 No.8

X-Ray Topography for Non-destructive Characterization of Materials.

M.P. Hentschel, D. Ekenhorst, K.-W. Harbich, A. Lange, J.V. Schors - BAM, Germany.


Keywords: Materials Characterization, X-Ray

Abstract

Abstract Source:
Book of Abstracts, 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN: 87-986898-0-00

Full-Text Source:
Proceedings of the 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN:

Publication Contact:
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