NDTnet 1998 Aug, Vol.3 No.8

High Resolution Intelligent Pigging Data: A Basis for Risk Assessment.
J. Rosenmöller - H. Rosen Engineering, Germany.
Keywords: Pipeline
Abstract
In recent years an increasing number of pipeline operators are evaluating the potential of assessing the risk factors to safely operate their pipeline system. The risk assessment strategies vary from a rathertheorectical to a more practical approach. However, in both cases a great number of parameters have to be gathered, and a database for the entire length of each section has to be established. While some of the data might be readily available, others will have to be established with significant cost and time effort involved. Most of the risk assessment models currently being discussed do not consider data from smart pig runs as a primary source for the assessment.This paper will provide information about the potential of using the data.Hypothesis
"Risk Assessment studies can rely on inspection of intelligent pig surveys."
Content
Nowadays, the results of MFL surveys are more reliable than they used to be in the eighties. There are 6 main reasons for this:
| 1980 | 1997 |
| a) Recording of magnetic level | none | constantly |
| b) MFL measurement | single direction | two directions |
| c) Sensor spacing | 200 mm | 13 mm |
| d) Speed measurement | hardly | constantly |
| e) Wall thickness measurement | none | constantly |
| f) Sufficient magnetization level | hardly | constantly |
Confidence in the reliability of intelligent pig services can be established prior to placing the order bychecking whether the following points can be proven:
- Repeatable results of measurement method
- Tracing the conditions of measurement
- Qualifying the inspection data
- Optimized use of recorded data
- Possibility of further analyzing any point of the pipe wall
Abstract Source:
Book of Abstracts, 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN: 87-986898-0-00
Full-Text Source:
Proceedings of the 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN:
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