In present article theoretical and experimental problems of creation and application of ultrasonic tomographic technologies and systems for non-destructive testing and technical diagnostic has been investigated. New methology and conception of application of such technologies and systems has been presented. She includes forming of "statistical standard", search of anomalous regions in NDT object volume and restoring in these regions of space distribution of investigated chracteristics distinctions from standard sizes.
In process of NDT object function the material properties changes (from material fatigue appearance and increase to defect rise, evolution and accumulation). It has been separated two material states: predefective and defective. A predefective material state is characterised by weak contrast and slow change character of physical and mechanical characteristic space volume distribution (elastic modules, stress tenzor etc). A detective material state is characterised by following peculiarities: defect appearance is casual and unlikely phenomena; basis material volume is undefective; defect presence is characterised by acoustic parameters jump on its boundary.
It has been described new ultrasonic tomographic systems for restoring of acoustical images of internal defective structure of strong inhomogeneous composition material workpieces and for restoring of space volume distribution of mechanical and strong characteristic of thick-leaf metal workpieces when performance of testing is realized from one-side access to workpiece surface. Also it has been described by stages developted information tomographic technologies and ultrasonic NDT methods. It has been shown experimental acoustical tomographic images of internal workpieces volumes, which allows to diagnose of defective or predefective material states.
Abstract Source:
Book of Abstracts, 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN: 87-986898-0-00
Full-Text Source:
Proceedings of the 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN:
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