NDTnet 1998 Aug, Vol.3 No.8

Abstract

Introduction
For safety reasons, the main components of industrial installations must undergo NDT so as to guarantee the functional capacities of equipment by verifying the integrity of the materials. This paper presents the EDF project to improve the quality for detection, localization and characterization of incoming faults inside materials, and to increase the performance of X or radiographic analysis.

Fig. 2D Measurement Fig. Notch Radiograph ; Fig. 3D result

Improved inspection analysis
Though advances have been made in digital information processing, the majority of radiographs is still performed with conventional films, especially due to limitations in the spatial resolution of the digital radiographic systems. So testers are confronted with the delicate task of establishing a complete diagnosis including the precise positioning of the faults within the thickness of the part being tested.

Since one year EDF is evaluating the performance of the RADView^LIBERTY film digitizer and of some tools developed by its R&D Division, like the ENTRAIGUES and the SIROCCO-3D software tools which enables 2D or 3D information processing, by means of a number of radiographic projections acquired from different angles in order to reconstitute the volume surrounding any faults. The 3D technique has been evaluated in radiographtesting of metal parts using a specific test protocol, in order to guarantee the desired degree of precision.The complementary destructive assessments carriedout on these parts have enabled verifying the good match in fault localization and confirm the quality of the results for a more precise diagnosis.

This paper reviews the performances obtained on some specific radiographic inspection, and illustrates the perspective of use of such tools in the overall maintenance program of EDF.

Abstract Source:
Book of Abstracts, 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN: 87-986898-0-00

Full-Text Source:
Proceedings of the 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN:

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