The physics of X-ray refraction are analogous to the well known refraction of light b optical lenses and prisms, governed by Snell's law. The special feature is the deflection a very small angles of few minutes of arc, as the refractive index of X-rays in matter i nearly one. Due to the density differences at inner surfaces most of the incident X-rays ar deflected. As the scattered intensity of refraction is proportional to the specific surface of sample, a reference standard gives a quantitative measure for analytical determinations.
Figure 1 represents a two-dimensional damage distribution of an impact in a 0/90° CFR laminate of 3 mm, thickness. Unlike in ultrasonic testing, there is no shadowing effect o the successive layers. By use of X-ray refraction the exact concentration of debonde fibres is calculated for each position. Additionally the refraction allows the selection of th fibre orientation.
 Fig. 1: High resolution X-ray refraction topography of low energy impact (5J) on CFRP epoxy laminate (signal from vertical fibres). Image area: 2 mm x 4 mm. Horizontal resolution: 0.2 mm. |
Abstract Source:
Book of Abstracts, 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN: 87-986898-0-00
Full-Text Source:
Proceedings of the 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN:
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