NDTnet 1998 Aug, Vol.3 No.8

Abstract

Through solving reverse defectometric problem an algorithm has been worked out for checking defects' depth i with supressed influence of its length L and thickness T basing on a monocrystal micro-computer. Basing on this algorithm a universal instrument has been created for defects' depth monitoring with any sensors without preliminary graduation.

Additional h measurement errors resulting from variable l and T have been analyzed. It's been revealed, that while for short cracks (L / H < 3) additional error can reach 100%, the proposed algorithm can minimize additional L and T variations-based error to 2 - 5 %.

The new algorithm is used to interpret measurements results in the new computerized cracks depth measuring device Zond IGT-97. This device allows to measure complicated surface cracks depth through sample self-education feature, which allows to retain up to ten graduate characteristics in the micro-computer memory.

The device is autonomously-powered, weights less than 2 Kgs and provides cracks depth measurement from 0.2 mm to 100 mm with 10 % error, irrespective of the crack's length and the article's thickness.

Abstract Source:
Book of Abstracts, 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN: 87-986898-0-00

Full-Text Source:
Proceedings of the 7th European Conference on Non-Destructive Testing, 26-29 May 1998, ISBN:

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