X-ray Micro Diffraction - Part 2: X-ray Rotation-Tilt Method
Jürgen Bauch, Hans-Jürgen Ullrich, Marian Böhling, Dresden
ABSTRACT There are world-wide efforts to analyse micro regions of compact samples by means of X-ray diffraction ("X-ray Micro Diffraction"). Two micro diffraction procedures, the KOSSEL technique (part 1) excited by electron or synchrotron radiation beams and the new X-ray Rotation-Tilt Method (part 2), are compared to show their possibilities and limitations. This techniques can be applied to a wide range of analytical problems in materials diagnostics, e.g.: high-accuracy determination of crystallographic orientations, dislocation density determination, determination of decrease in symmetry, high-accuracy determination of lattice constants, precision determination of residual stresses of the second and the third kind as well as phase identification in micro regions. Some selected examples are presented. A comparison to the KOSSEL technique is also included.
Publication Source: Materialprüfung, ISSN: 0025-5300
Issue: 2004-3, pp -
Publisher: Carl Hanser Verlag München
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