Microstructure Characterization by the Focussed Ion Beam (FIB) Technology
Werner Österle, Berlin
ABSTRACT The present contribution summarizes the highlights of a symposium which took place on May 13 th last year at the Federal Institute for Materials Research and Testing. It was motivated by the fact that a new FIB equipment has been installed at the Department V >Material Engineering<. BAM is one of the first places in Germany which applied this innovative technology on general mechanical engineering questions.
Publication Source: Materialprüfung, ISSN: 0025-5300
Issue: 2004-3, pp -
Publisher: Carl Hanser Verlag München
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