Abstract:
Electrically based microstructure characterization is often used to correlate the performance of an electronic device to its microstructure. However, electrical measurements may also be used as a non-destructive technique in order to characterize the microstructure of a wide range of materials regardless of what their end function might be. This is particularly true for composite materials where one phase has substantially different electrical properties from the other, but it also applies to singly phase ceramics undergoing densification where the poros and-or the grain boundary region may behave differently from the host material. In this talk, we will address the advantages as well as the difficulties or using resistivity, dielectric constant and dielectric loss measurements for monitoring microstructural changes in materials. Examples dealing with partial densification, detection of phase transformations, orientation of second phases, and detection of mechanical and environmental degradation Will be given.
(Ref. SXVIII-012-97)
Source: NDE of Ceramics '97 May 4-7, Symposium on Nondestructive Evaluation of Ceramics
at the American Ceramic Society 99th Annual Meeting, Cincinnati, Ohio.
Buying the Symposium Proceedings from the American Ceramic Society.
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