SPIE Abstracts: Ultrasonic and NDT methods for thickness measurement


SPIE - The International Society for Optical Engineering
SPIE is a non-profit professional society dedicated to advancing research, engineering, and applications in
optics, photonics, imaging, and electronics.
Home Page Review by Rolf Diederichs explains what NDT resources are available on SPIE Web.
For more information see also:
Thickness Measurement in UTonline 10/97

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©copyright Rolf Diederichs 01. Oct 1997, rd@ndt.net