Abstract:
Universal Phased Array UT Probe for Nondestructive Examinations using Composite Crystal Technology

by J. Ritter

The German version of this paper was presented at the DGZfP Symposium Wissenschaftliches Kolloquium Grundlagen der Zerstörungsfreien Prüfung(Research in NDT) during the MTQ Exhibition Report 12.-15.11.1996 in Dortmund D.


1. Introduction

Author:


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