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16th WCNDT 2004 - World Conference on NDT
CD-ROM Proceedings, Internet Version of ~600 Papers
Aug 30 - Sep 3, 2004 - Montreal, Canada
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SESSION: HIGH RESOLUTION ULTRASONIC
ABSTRACT:
TIME OF FLIGHT DIFFRACTION (TOFD) TECHNIQUE FOR ACCURATE SIZING OF 
SUBCLADDING EMBEDDED CRACKS
S. Baby1, T. Balasubramanian1, R.J.Pardikar2, M.Palniappan3, and R.Subbartanam3
1Department of Physics, National Institute of Technology, India; 2NDTL, Bharat Heavy Electricals Limited, 
India; 3 Indira Gandhi Centre for Atomic Research, India

This paper deals with an experimental study for evaluation of Time-of-flight diffraction (TOFD) for 
determination of size of the embedded subcladding cracks. TOFD equipment Model MICROPLUS of M/s 
AEA Technology, UK with manual scanner along with longitudinal angle beam probes of 45¡-4MHz was 
used for the study. The steel test blocks used for the study contained 0.5mm wide vertical/inclined simulated 
cracks (machined slits)inclination (10¡ and 15¡) of various heights ranging from 1.68mm to 19.04mm 
underneath the Stainless steel, Inconel and Ferritic cladding. The experimental results have shown excellent 
correlation between the actual and estimated through thickness height and length of the simulated cracks 
with a mean error of ±0.18mm (vertical slits)and ±0.14mm (inclined slits). The proven level of accuracy 
attainable is found to be within ±0.2mm in terms of critical through wall extent and ±0.9mm in terms of 
horizontal dimension. It has been observed that TOFD suffers from a near surface effect caused by its 
inherent lateral wave. Difficulty was experienced using TOFD to detect and size cracks starting from the 
interface between inconel /Stainless Steel cladding and the ferritic base i.e. (5mm/6mm below the scanning 
surface). This is due to lateral wave, which obscures the tip-diffracted signals from the defects close to the 
surface. However, these cracks could be well detected and sized by scanning through the cladding from the 
opposite surface of the blocks. Even the small cracks of the order of 1.9mm could be detected as long as 
they are not influenced by the lateral wave.
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MAIN AUTHOR:Sony Baby, National Institute Of Technology (regional Engg. College), India
Paper CODE: 5

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