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16th WCNDT 2004 - World Conference on NDT
CD-ROM Proceedings, Internet Version of ~600 Papers
Aug 30 - Sep 3, 2004 - Montreal, Canada
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SESSION: THERMOGRAPHY, THERMAL TEC
ABSTRACT:
AUTOMATIC ALGORITHM FOR QUANTITATIVE PULSED PHASE THERMOGRAPHY 
CALCULATIONS
C. Ibarra-Castanedo, D. Gonz‡lez, X. Maldague
Université Laval, Quebec, Quebec, Canada 

Pulsed Phase Thermography (PPT) is a NDT technique combining interesting features from Pulse 
Thermograhy (PT) and Lock-In Thermography (LT), i.e. PPT is a rapid and easy to deploy technique (as 
PT) providing phase delay images (as LT) after processing. It is well known that phase is less affected by 
non-uniform heating, surface emissivity variations and non-planar surfaces. As a result, PPT has been 
successfully applied for defect detection purposes. In contrast, a great deal of work has been carried out in 
order to evaluate the potential of PPT for quantitative applications using Statistical methods, Neural 
Networks or Wavelet Transform. However, calibration requirement and lengthy computation subroutines, 
precludes its use on most NDT applications. A new inversion technique, based on phase delay data, has been 
recently proposed by the authors. Quantification is carried out by correlating defect depth with its 
corresponding blind frequency, i.e. the frequency at which the defect becomes visible for the first time on 
the phase spectra. Estimation of the blind frequency is performed however using phase contrast calculations, 
which means that a non-defective zone on the sample surface is needed on the computations. On the other 
hand, as will be stressed on this paper, there exists an “optimal” sampling frequency at which the phase for a 
given defect depth can be calculated without aliasing. This frequency is in fact equivalent to the blind 
frequency, the only two requirements are that (1) the temporal truncation window is large enough to hold all 
the important thermal information, and (2) the sampling theorem is respected for all defects. We propose 
here an algorithm for the automatic location of the optimal sampling frequency using phase profiles instead 
of phase contrast profiles, eliminating in this way the need of a sound area. 
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MAIN AUTHOR:Clemente Ibarra-Castanedo, Computer Vision & Systems Laboratory, Canada
Paper CODE: 62

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