Home
Home
16th WCNDT 2004 - World Conference on NDT
CD-ROM Proceedings, Internet Version of ~600 Papers
Aug 30 - Sep 3, 2004 - Montreal, Canada
START
Home

First 1st    previous prevWCNDT 2004 - Abstractsnext next

SESSION: NEW TECHNIQUES
ABSTRACT:
 
 
QUANTITATIVE RUST-UNDER-PAINT DETECTION UTILIZING NEAR-FIELD MICROWAVE 
NDE TECHNIQUES 
M. AbouKhousa1 , N. Qaddoumi2, and T. Ibrahim2
1 Concordia University, Montreal, Quebec, Canada; 2 American University Of Sharjah, Sharjah, United Arab 
Emirates 

Near-field microwave NDE systems utilizing open-ended rectangular waveguides   constitute a competent 
candidate to detect and evaluate planner rust layers under paint coatings. Basically, the waveguide 
illuminates the specimen with microwave signals and monitors the reflected waves. Minute variations in the 
structure reflect in measurable variation in the reflection coefficient at the waveguide aperture. The 
functional dependence of reflection coefficient on the rust layer physical propertiesÑi.e. thickness and 
depthÑis exploited in the detection schema. Upon measuring the reflection coefficient, the inverse problem 
of rust thickness and depth determination should be solved. This problem is ill-posed in nature and requires 
sophisticated algorithm to be inverted quantitatively. In this paper, we will introduce a Maximum-
Likelihood algorithm to be applied in conjunction with multi-frequency measurements to solve the inverse 
problem. As it will be shown, the multi-frequency measurements will provide diversity gain over the 
uncertainties embedded in the system. The practical potential of the proposed algorithm will be 
demonstrated in real life rust under-paint detection problem. Finally, the performance of the algorithm under 
measurement noise will be simulated and analyzed. It will be shown that the proposed algorithm provides 
significant accuracy with high sensitivity in determining the rust layer’s thickness and depth.  




Full-Text HTML-txtQuick PDF Preview
Full-Text PDF (KB)pdfPDF 222
Full-Text HTML:
OPTION (MB):
MAIN AUTHOR:Mohamed Aboukhousa, Concordia University, Canada
Paper CODE: 73

© NDT.net