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WCNDT '96 - New Delhi
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DENSITY MEASUREMENT BY A HIGH ENERGY X-RAY CT SYSTEM

Takahiro Kanamori
Hitachi Ltd., Hitachi Works, Quality Assurance Dept
Hitachi-shi, Ibaraki-ken, 317 Japan
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 3, pages 1415 - 1418
Publisher: Ashgate Publishing Company

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