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WCNDT '96 - New Delhi
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TOFD & ACCEPTANCE CRITERIA: A PERFECT TEAM

F. H. Dijkstra and J. A. de Raad
RTD, Rotterdam, The Netherlands
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 4, pages 2329 - 2334
Publisher: Ashgate Publishing Company

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