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WCNDT '96 - New Delhi
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TESTING AND MONITORING WITH MICROWAVE RESONANT STRUCTURES: APPLICATIONS AND MODELS

Nathan Ida
Department of Electrical Engineering, The University of Akron, Akron, OH. 44325-3904, USA
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 1, pages 259 - 264
Publisher: Ashgate Publishing Company

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