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WCNDT '96 - New Delhi
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APPLICATION OF ELECTRICAL IMPEDANCE FOR DETECTION OF DEBONDING IN DENTED HONEY COMB STRUCTURES

Dominic Joseph, K. M. Verghese and R. E. Darange
Central Laboratory, Hindustan Aeronautical Laboratory, Nasik, India
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 3, pages 1681 - 1686
Publisher: Ashgate Publishing Company

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