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WCNDT '96 - New Delhi
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UNCERTAINTY AND RELIABILITY OF THE NONDESTRUCTIVE TESTING SYSTEM

Chin-Min Chang, Yih-Kuen Chen, Hong-Yie Chen & Chih-Han Wang
Chung Shan Institute of Science & Technology
Taiwan, R. O. C
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 3, pages 1381 - 1384
Publisher: Ashgate Publishing Company

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