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WCNDT '96 - New Delhi
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APPLICATIONS OF NDT TO FAILURE ANALYSIS AND QUALITY IMPROVEMENT FOR SOME TYPICAL MISSILE COMPONENTS

Hsi-Ying Chow, Yung-Chuan Pan, Chi-Min Chang, Hong-Yie Chen and Chih-Han Wang
Chung Shan Institute of Science & Technology, Taiwan, R. O. C
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 2, pages 513 - 516
Publisher: Ashgate Publishing Company

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