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WCNDT '96 - New Delhi
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LOCALIZATION OF REGION OF SURFACE ROUGHNESS OF THIN WIRES USING LASER SCATTERING

C. Babu Rao, A. V. Ananthalakshmi and R. Kesavamoorthy
Metallurgy and Materials Group
Indira Gandhi Center for Atomic Research, Kalpakkam 603 102, India
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 3, pages 1517 - 1520
Publisher: Ashgate Publishing Company

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