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WCNDT '96 - New Delhi
Table of Contents
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AN EDDY CURRENT PARAMETRIC MODEL FOR FLAW CHARACTERIZATION

Remy La, Bruno Benoist, Regis Lengelle*, Paul Gaillard*, Jacques Reuchet**
"Commissariat a l'Energie Atomique" (CEA/CEREM/STA), France
*Department of Electrical Engineering, University of Technology of Compiegne, France
**"Commissariat a l'Energie atomique" (CEA/IPSN/DES), France
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 3, pages 1753 - 1756
Publisher: Ashgate Publishing Company

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