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WCNDT '96 - New Delhi
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A PORTABLE HIGH RESOLUTION COMPTON BACKSCATTER SCANNING INSTRUMENT

Hou Ben. Ding, Hong. Li, et al
LAMBEAU High Sci. and Tech. Enterprise Group Ltd. Liability Co., P. C. 215006 Suzhou, China
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 2, pages 353 - 356
Publisher: Ashgate Publishing Company

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