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WCNDT '96 - New Delhi
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IMPROVING ACTUAL FILM QUALITY USING IMAGE QUALITY PARAMETERS FROM NEW NATIONAL AND INTERNATIONAL STANDARDS

Mike Knell

ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 3, pages 1351 - 1356
Publisher: Ashgate Publishing Company

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