NDTnet

WCNDT '96 - New Delhi
Table of Contents
start  previousAET - AET - Signal Processingnext

PATTERN RECOGNITION OF THE CHARACTERISTICS OF AE SOURCE USING ARTIFICIAL NEURAL NETWORK

Ma Yukuan, Dong Yunzhao, Li Jial in
Research Institute of Non-Destructive, Testing Department of Electrical Engineering
JiLin University of Technology, Changchun-130025, China
ABSTRACT
start  previousAET - AET - Signal Processingnext

Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 4, pages 2559 - 2564
Publisher: Ashgate Publishing Company

© NDTnet