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WCNDT '96 - New Delhi
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THE SMALLEST DEFECT THAT CAN BE DETECTED USING ULTRASONIC TESTING

Yan-Rongming, Deng-Jianping*
Shenzhen Airlines, P. R. CHINA
*Nanchang Institute of Aeronautic Technology
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 2, pages 957 - 960
Publisher: Ashgate Publishing Company

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