NDTnet

WCNDT '96 - New Delhi
Table of Contents
start  previousRT - Tomography (X-Ray and Gamma Ray)next

STATISTICAL PARAMETER ESTIMATION OF A GAMMA RAY TOMOGRAPHIC SCANNER SYSTEM FOR QUALITY ASSURANCE

G. L. Baheti, P. K. Khatri, Nisheet Saxena and L. R. Meghwal
NDT Group, Defence Laboratory, Jodhpur 342 011, India
ABSTRACT
start  previousRT - Tomography (X-Ray and Gamma Ray)next

Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 3, pages 1439 - 1442
Publisher: Ashgate Publishing Company

© NDTnet