NDTnet

WCNDT '96 - New Delhi
Table of Contents
start  previousIRT - Full Paper Not Received next

TRANSIENT THERMOGRAPHY DATA PROCESSING AND SIZING BACK DRILLED HOLE ARTIFICIAL DEFECT

A. R. Hamzah, D. P. Almond, P. M. Delpech and M. Saintey
School of Material Science
University of Bath, England
ABSTRACT
start  previousIRT - Full Paper Not Received next

Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.full paper not received
Publisher: Ashgate Publishing Company

© NDTnet