SURFACE BRILLOUIN SCATTERING AS A TOOL FOR NDT & E

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WCNDT '96 - New Delhi
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RT - X-Ray and Gamma Ray Techniques

SURFACE BRILLOUIN SCATTERING AS A TOOL FOR NDT & E

J. D. Comins, A. G. Every, W. Pang and P. R. Stoddart
Physics Department, University of the Witwatersrand
P. O. WITS 2050, Johannesburg, Sourth Africa

Keywords: Surface Brillouin Scattering, Films, Silicon, Fabry-Perot interferometry, NDT

ABSTRACT

REFERENCES

P. Mutti, C. E. Bottani, G. Ghislotti, M. Beghi, GA. D. Briggs and J. R. Sandercock, "Surface Brillouin Scattering - Extending Surface Wave Measurements to 20 GHz", in Advances in Acoustic Microscopy, Vol. 1, (Edited by Andrew Briggs) Plenum, New York, 1995
P. R. Stoddart, J. D. Comins and A. G. Every, "Brillouin Scattering Measurements of Surface Acoustic Wave Velocities in Silicon at High Temperatures", Phys. Rev. B51, pp. 17574- 17578, 1995
W. Pang, P. R. Stoddard, J. D. Comins, A. G. Every, D. Pietersen and P. J. Marais, "Elastic Properties of TiN Hard Films at Room and High Temperatures Using Brillouin Scattering", Int. J. Refractory Metals and Hard Materials, in press, 1996

RT - X-Ray and Gamma Ray Techniques

Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 3, pages 1293 - 1296
Publisher: Ashgate Publishing Company