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WCNDT '96 - New Delhi
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A NON-DESTRUCTIVE TESTING TECHNIQUE INVOLVING FLUORESCENT X-RAY ABSORPTION SPECTROMETRY FOR MEASURING CHROMIUM PLATING THICKNESS ON SS-316 SUB-ASSEMBLIES OF INDIAN FAST BREEDER TEST REACTOR

H. R. Ravindra, G. Radhakrishna, B. Gopalan and S. Syamsundar
Control Laboratory, Nuclear Fuel Complex (DAE), Hyderabad 500 062, India
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 2, pages 435 - 440
Publisher: Ashgate Publishing Company

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