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WCNDT '96 - New Delhi
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SHEARING PATTERN INTERFEROMETER FOR NON-DESTRUCTIVE EVALUATION OF COMPOSITE MATERIALS

Deepak Bansal*, Kameshwar Rao** and C. R. L. Murthy*
*Dept. Of Aerospace Engg, Indian Institute of Science, Bangalore, India
**Dept. Of Instrumentation, Indian Institute of Science, Bangalore, India
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.full paper not received
Publisher: Ashgate Publishing Company

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