NDTnet

WCNDT '96 - New Delhi
Table of Contents
start  previousNDT - Signal Processing and Expert Systemsnext

STOCHASTIC MODELING OF FATIGUE CRACKS FOR REAL-TIME MONITORING & PROGNOSTICS

Sekhar Tangirala*, and Asok Ray
Department of Mechanical Engineering
The Pennsylvania State University, University Park, PA 16802
ABSTRACT
start  previousNDT - Signal Processing and Expert Systemsnext

Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 3, pages 1825 - 1830
Publisher: Ashgate Publishing Company

© NDTnet