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WCNDT '96 - New Delhi
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INFRARED INTERFEROMETERS FOR NDE AND FAILURE CHARACTERIZATION

Jaydeep K. Sinha and Hareesh V. Tippur
Department of Mechanical Engineering
202 Ross Hall, Auburn University, Auburn, Alabama 36849-5341
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.Vol. 5, pages 57 - 58
Publisher: Ashgate Publishing Company

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