NONDESTRUCTIVE CHARACTERIZATION OF BILAMELLAR NONMETALLIC STRUCTURES BY CHARGE-TRANSFER TECHNIQUE UNDER UNILATERAL ACCESS CONDITIONS
Yanis I. Bulbik
Siberian Aerospace Academy, Krasnoyarsk-660014, Russia
Keywords: ECT, NDT, bilamellar, algorithm, composite
ABSTRACT The electric charge-transfer (ECT) nondestructive technique is known to be effective if it may be explicitly or conventionally characterized by bilateral access conditions. However, a requirement of bilateral accessibility is a stumbling block to use the ECT technique, except to some appropriate cases, presented by [1], for example, when only an external surface of sidewall locality, being under test, has to be exposed to a strong pulsing electric field providing the polarization and absorption currents resulted in an evaluation of charge-transfer amounts for predetermined time intervals by an integrating circuit. A novel nondestructive characterization technique is applied to the ECT monitoring of bilamellar structures as bearing composite cylindrical or conical shells having some protective nonmetallic external coatings. The ECT transducer operation is based on the principle of a transient electric charges reproduction on the two-strip sensory electrodes adjoined to the external medium and placed symmetrically between the high and low potential supply zones of pulsed electric field. Some features of the ECT transducer design and its facilities are considered. A potential field distribution in the layered dielectrical surrounding adjoined to extended coplanar strip electrodes is examined by an integral equation method as a theoretical model which allows to stipulate few useful algorithms for the bilamellar structure parameters monitoring under unilateral access conditions.
REFERENCE
- K. Nagamatsu et al., "Method and apparatus for defect inspection of liquid-filled insulating container", US Patent N. 4125805 (Int. Cl. GO1R 31/12, GOIN 27/60), 1984
Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.full paper not received
Publisher: Ashgate Publishing Company
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