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WCNDT '96 - New Delhi
Table of Contents
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LIFETIME, TOUGHNESS AND RELIABILITY OF ENGINEERING THERMOPLASTICS

Chudnovsky, D. Baron, Y. Shulkin, K. Sehanobish* and C. P. Bosnyak*
Dept. of Civil & Materials Engineering
University of Illinois at Chicago, 842 W. Taylor, Chicago IL 60607
*The Dow Chemical Company, Freeport, TX 77566
ABSTRACT
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Publication Source: Trends in NDE Science & Technology; Proceedings of the 14th World Conference on Non-Destructive Testing, New Delhi, 8-13 December 1996.full paper not received
Publisher: Ashgate Publishing Company

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