ECNDT 2006


Main Sponsors:

YXLON

RTD

Sponsors:

Helling

GE Inspection Technologies

Sonatest

Olympus NDT

Karl Deutsch

Kodak

Dürr NDT

intelligeNDT

Topics

Digital Radiology

Tu.2.4.2 Building Blocks of a third generation Automatic Defect Recognition system
Herold, F., YXLON International X-Ray, Hamburg (Germany)
Grigat, R.-R., TU Hamburg-Harburg (Germany)
Bavendiek, K., YXLON International X-Ray, Hamburg (Germany)
Frantz, S., YXLON International X-Ray, Hamburg (Germany)
Manuscript
Tu.2.4.3 A New System for Fully Automatic Inspection of Digital Flat-panel Detector Radiographs of Aluminium Castings
Fuchs, T., Fraunhofer EZRT, Fürth (Germany)
Haßler, U., Fraunhofer EZRT, Fürth (Germany)
Hütten, U., Fraunhofer EZRT, Fürth (Germany)
Wenzel, T., Fraunhofer EZRT, Fürth (Germany)
Manuscript
Tu.2.4.4 Fully Automated Inspection of Welded Seams with a New High Resolution Durable X-ray Camera System
Wenzel, T., Fraunhofer EZRT, Fürth (Germany)
Fuchs, T., Fraunhofer EZRT, Fürth (Germany)
Hütten, U., Fraunhofer EZRT, Fürth (Germany)
Schmitt, P., Fraunhofer IIS, Erlangen (Germany)
Behrendt, R., Fraunhofer Institut IIS, Erlangen (Germany)
Kostka, G., Fraunhofer Institut IIS, Erlangen (Germany)
Krämer, J., GE Inspection Technologies, Ahrensburg (Germany)
Manuscript
We.2.5.1 Image Quality of High Definition Computed Radiography (HDCR) in NDT
Thoms, M., Dürr NDT, Bietigheim-Bissingen (Germany)
Ewert, U., BAM Berlin (Germany)
Zscherpel, U., BAM Berlin (Germany)
without manuscript
We.2.5.2 Modular concept of radiological machines for industrial inspection of castings and weldments
Ruef, C., YXLON International X-Ray, Hamburg (Germany)
without manuscript
We.2.5.3 DEFECT DETECTION METHOD IN DIGITAL RADIOGRAPHY FOR POROSITY IN MAGNESIUM CASTINGS
Rebuffel, V., LETI, Grenoble (France)
Sood, S.C., Computerised Information Technology Ltd., Milton Keynes (United Kingdom)
Blakeley, B., TWI, Cambridge (United Kingdom)
Manuscript
We.2.5.4 EVALUATION OF AN AUTOMATIC THICKNESS MEASUREMENT SYSTEM FOR DIGITIZED RADIOGRAPHS
Movafeghi, A., Safety & Radiological Protection Technological Center, Tehran (Iran)
Rastkhah, N., Atomic Energy Organization of Iran, Tehran (Iran)
Taheri, M., Atomic Energy Organization of Iran, Tehran (Iran)
Edalati, K., Safety & Radiological Protection Technological Center, Tehran (Iran)
Mohammadzadeh, N., Safety & Radiological Protection Technological Center, Tehran (Iran)
Rokrok, B., Safety & Radiological Protection Technological Center, Tehran (Iran)
Manuscript
Th.1.3.1 DUAL-ENERGY X-RAY IMAGING: BENEFITS AND LIMITS
Rebuffel, V., LETI, Grenoble (France)
Dinten, J.-M., LETI, Grenoble (France)
Manuscript
Th.1.3.2 High-Speed Flash X-Ray Cinematography
Nau, S., Ernst-Mach-Institut, Efringen-Kirchen (Germany)
Helberg, P., Ernst-Mach-Institut, Efringen-Kirchen (Germany)
Thoma, K., Ernst-Mach-Institut, Efringen-Kirchen (Germany)
Manuscript
Th.1.3.3 Radiographic and Tomographic Testing of Wood
Osterloh, K., BAM Berlin (Germany)
Alekseychuk, O., BAM Berlin (Germany)
Ewert, U., BAM Berlin (Germany)
Goebbels, J., BAM Berlin (Germany)
Hasenstab, A., BAM Berlin (Germany)
Meinel, D., BAM Berlin (Germany)
Zscherpel, U., BAM Berlin (Germany)
Manuscript
Th.1.3.4 Variants to Non-Linear Filter Techniques for Defect Segmentation in Digital Radiographs of Castings
Kommareddy , V.K., GE Global Research Center, Bangalore (India)
Manoharan, V., Gen. Electric Ind. Imaging and Modeling Lab., Bangalore (India)
Navalgund, M., Gen. Electric Ind. Imaging and Modeling Lab., Bangalore (India)
Swamy, G., Gen. Electric Ind. Imaging and Modeling Lab., Bangalore (India)
Venkatachalam, R., Gen. Electric Ind. Imaging and Modeling Lab., Bangalore (India)
Manuscript
Th.3.2.1 New Digital Radiography Procedure Exceeds Film Sensitivity Considerably in Aerospace Applications
Bavendiek, K., YXLON International X-Ray, Hamburg (Germany)
Ewert, U., BAM Berlin (Germany)
Zscherpel, U., BAM Berlin (Germany)
Meade, W.D., Boeing Commercial Aircrafts, Seattle, WA (USA)
Heike, U., YXLON International X-Ray, Hamburg (Germany)
Manuscript
Th.3.2.2 Successful Conversion to Digital X-Ray Detectors
Boiy, L., GE Inspection Technologies BVBA, Berchem (Belgium)
Manuscript
Th.3.2.3 Digital Radiography for the Inspection of Small Defects
Blakeley, B., TWI, Cambridge (United Kingdom)
Spartiotis, K., Oy AJAT Ltd., Espoo (Finnland)
Manuscript
Th.3.2.4 Stationary & Portable Use of a-Si Flat Panels in NDT Industries
Diamond, A., Vidisco, Petachtikva (Israel)
Manuscript