ECNDT 2006


Main Sponsors:

YXLON

RTD

Sponsors:

Helling

GE Inspection Technologies

Sonatest

Olympus NDT

Karl Deutsch

Kodak

Dürr NDT

intelligeNDT

Topics

TeraHertz

Tu.1.8.1 Large Area Terahertz Imaging and Non-Destructive Evaluation Applications
Zimdars, D., Picometrix, Ann Arbor (USA)
Chernovsky, A., Picometrix, Ann Arbor (USA)
Fichter, G., Picometrix, Ann Arbor (USA)
Stuk, G., Picometrix, Ann Arbor (USA)
White, J., Picometrix, Ann Arbor (USA)
Williamson, S., Picometrix, Ann Arbor (USA)
Manuscript
Tu.1.8.2 CONTACTLESS THICKNESS MEASUREMENTS OF GLASS WALLS BY USING MICROWAVE RELFECTIONS
Hinken, J.H., Hochschule Magdeburg-Stendal, Magdeburg (Germany)
Beller, T., Hochschule Magdeburg-Stendal, Magdeburg (Germany)
Manuscript
Tu.1.8.3 Nondestructive and contactless materials characterization with the help of microwave sensors
Sklarczyk, C., Fraunhofer IZFP, Saarbrücken (Germany)
Melev, V., Fraunhofer IZFP, Saarbrücken (Germany)
Pinchuk, R., Fraunhofer IZFP, Saarbrücken (Germany)
Manuscript
Tu.1.8.4 MICROWAVE BASED NON-DESTRUCTIVE TESTING USING MODIFIED EDDY CURRENT SYSTEMS
Beilken, D., Hochschule Magdeburg-Stendal, Magdeburg (Germany)
Hinken, J.H., FI Test- und Messtechnik, Magdeburg (Germany)
Manuscript
Tu.1.8.5 Detection of surface defects in metallic materials using evanescent microwaves
Kerouedan, J., EDF, Chatou Cedex (France)
Le Brun, A., EDF, Chatou Cedex (France)
De Blasi, S., LEST-UBO, Brest Cedex (France)
Quéffélec, P., LEST-UBO, Brest Cedex (France)
Talbot, P., LEST-UBO, Brest Cedex (France)
Manuscript
Tu.2.8.1 Advanced Broadband Millimeter-Wave Characterization Techniques of Dielectrics
Gumbmann, F., Universität Erlangen (Germany)
Schmidt, L.-P., Universität Erlangen (Germany)
Tran, P., Universität Erlangen (Germany)
Weinzierl, J., Universität Erlangen (Germany)
Manuscript
Tu.2.8.2 Noncontact terahertz paintmeter for real-time two-dimensional cross-section imaging of paint film thickness
Yasui, T., Osaka University, Osaka (Japan)
Araki, T., Osaka University, Osaka (Japan)
Sawanaka, K.-i., Osaka University, Osaka (Japan)
Yasuda, T., Osaka University, Osaka (Japan)
Manuscript
Tu.2.8.3 Characterization of Surface Structures using THz Radar Techniques with Spatial Beam Filtering and Out-of-Focus Detection
Hils, B., JWG Universität, Frankfurt a. Main (Germany)
Löffler, T., JWG Universität, Frankfurt a. Main (Germany)
Roskos, H.G., JWG Universität, Frankfurt a. Main (Germany)
Hasegawa, N., Nippon Steel Corporation, Chiba (Japan)
Manuscript
Tu.2.8.4 Diode laser based Terahertz radiation sources
Hofmann, M., Ruhr-Universität, Bochum (Germany)
Brenner, C., Ruhr-Universität, Bochum (Germany)
Hoffmann, S., Ruhr-Universität, Bochum (Germany)
Le, N.T., Ruhr-Universität, Bochum (Germany)
without manuscript
We.2.8.1 Imaging Capability of Terahertz and Millimetre-Wave Instrumentations for NDT of Polymer Materials
Beckmann, J., BAM Berlin (Germany)
Ewert, U., BAM Berlin (Germany)
Richter, H., BAM Berlin (Germany)
Zscherpel, U., BAM Berlin (Germany)
Hübers, H.-W., DLR, Institut für Planetenforschung, Berlin (Germany)
Richter, H., DLR, Institut für Planetenforschung, Berlin (Germany)
Koch, M., TU Braunschweig (Germany)
Rutz, F., TU Braunschweig (Germany)
Schmidt, L.-P., Universität Erlangen (Germany)
Weinzierl, J., Universität Erlangen (Germany)
Manuscript
We.2.8.2 Non-destructive testing of glass-fibre reinforced polymers using terahertz spectroscopy
Rutz, F., TU Braunschweig (Germany)
Ewert, U., BAM Berlin (Germany)
Hickmann, S., BAM Berlin (Germany)
Richter, H., BAM Berlin (Germany)
Trappe, V., BAM Berlin (Germany)
Koch, M., TU Braunschweig (Germany)
Wietzke, S., TU Braunschweig (Germany)
Manuscript
We.2.8.3 Detection of Separation in Laminated Materials by Reflected THz Pulses
Fletcher, J., University of Durham (United Kingdom)
Chamberlain, J.M., University of Durham (United Kingdom)
Dai, d.C., University of Durham (United Kingdom)
Gallant, A., University of Durham (United Kingdom)
Levitt, J., University of Durham (United Kingdom)
Swift, G.P., University of Durham (United Kingdom)
Manuscript
We.2.8.4 94 GHz Radar sensor for process control and imaging
Sklarczyk, C., Fraunhofer IZFP, Saarbrücken (Germany)
Surkov, A., Fraunhofer IZFP, Saarbrücken (Germany)
Langenberg, K.J., Universität Kassel (Germany)
Mayer, K., Universität Kassel (Germany)
Manuscript
P181 Non-Destructive Investigation of Paintings with THz-Radiation
Panzner, M., Fraunhofer IWS, Dresden (Germany)
Klotzbach, U., Fraunhofer IWS, Dresden (Germany)
Helm, M., FZR Forschungszentrum Rossendorf, Dresden (Germany)
Winnerl, S., FZR Forschungszentrum Rossendorf, Dresden (Germany)
Leitner, H., Hochschule für Bildende Künste, Dresden (Germany)
Köhler, W., Labor Köhler, Postdam (Germany)
Jördens, C., TU Braunschweig (Germany)
Koch, M., TU Braunschweig (Germany)
Rutz, F., TU Braunschweig (Germany)
Beyer, E., TU Dresden (Germany)
Manuscript