| NDT.net - October 2000, Vol. 5 No. 10 |
2nd International Conference on NDE in Relation to Structural Integrity for Nuclear and Pressurized Components, New Orleans May 2000. |
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New technology and equipment make arrays fast and cost-effective
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| Single-coil probes | Array probes | |||
| Inspectionspeed | Very slow | Very fast(10 to 100 times faster) | ||
| Analysis | C-scan and impedance plane (Lissajous) | C-scan and impedance plane (Lissajous) | ||
| Repeatability and reliability | Fair (manual) to good (automated) | Good | ||
| Records | Digital data storage(automated inspection) | Digital data storage | ||
| Scanner complexity | Medium to high(depending on part shape) | Very simple manual scanner | ||
| Table 1 | ||||
| Liquid penetrant | Array probes | |
| Inspection speed | Slow and delicate manual operations | Fast, no special preparation required |
| Analysis | Visual | C-scan and Lissajous |
| Repeatability | Operator dependent | Operator independent |
| Interferences from surface finish | No distinction between scratch and crack | Good, less sensitive to surface finish |
| Subsurface flaw detection | No | Yes |
| Depth determination | No | Yes |
| Waste production | Chemical waste | None |
| Automatic flawdetection | Complex and expensive | Simple |
| Records | None (or use of photo) | Digital data storage |
| Table 2 | ||
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Fig
Significantly reduces time exposure to radiations, inspection time, and consumable costsEPRI qualification pending |
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Better, Faster, Cheaper Inspections
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