Prof. Dr. Uwe Ewert
BAM-Berlin
Head of division VIII.3
NDT and Characterisation, Radiology
22/10/03 Dear friends and colleagues,

on behalf of the program committee of the 16th World Conference on NDT I would like to encourage you to submit papers for oral and poster presentations. Please note the dead line of Nov. 15th, 2003. Please note the dead line of Nov. 15th, 2003. Please forward this message also to possibly interested colleagues.

The World Congress on NDT will be held in Montreal, August 30 - September 3, 2004. I would like to see 3 sessions on advanced radiation techniques (see below). I am also hoping that we can attract papers from a diverse group of investigators and inspection methodologies.

For more information on the conference, please consult the web site www.wcndt2004.com.

Please make a note on your abstract that it is being submitted for one of the sessions below and also e-mail me a copy of your abstract so that I can keep track of them. If you have any question regarding this conference please do not hesitate to contact me.

I hope to see many of you at the conference and look forward to an exciting and informative session.

We plan to organise the following topics and invite you to contribute :

Radiography sessions of 16th WCNDT

• Digital Radiology
  • Computed Radiography
  • Detector Arrays / Flat Panels
  • Film Replacement
  • Automated Defect Recognition and Image Processing
  • Radiographic modelling
  • Industrial applications

1 invited, 10 contributed papers (4h)

• Computed Tomography
  • New techniques
    • High resolution CT
    • Reverse engineering
    • Special instrumentation and detectors
    • Special methods
    • Reconstruction algorithms and processing
    • Limited-data, -view, -angle reconstruction; laminography
    • Pre- and post processing, correction procedures
    • Computing strategies
    • Industrial applications

1 invited, 10 contributed papers (4h)

• Special radiological techniques
  • Radiography with particles
  • Synchrotron Applications
  • X-ray scattering
    • Topography
      • Strain measurements
    • Industrial applications

1 invited, 10 contributed papers (4h)

Best regards
Uwe Ewert