TOC - January 2001 : NDT plus

                       
JT Journal of manufacturing science and engineering
DA NOV 01 2000 v 122 n 4
PG 691   
AU Sprague, Jeffrey A.   
AU Eleftheriou, Evangelos C.   
AU Bates, Charles E.   
TI Non-Destructive Machinability Characterization of Materials through a   
   Correlation with Rate of Strain Sensitivity.   
SI 1087-1357(20001101)122:4L.691:NMCM;1-   
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JT Optics and lasers in engineering.
DA 2000 v 33 n 1
PG 49   
AU Aben, H.   
AU Ainola, L.   
AU Anton, J.   
TI Integrated photoelasticity for nondestructive residual stress measurement in
   glass.   
SI 0143-8166(2000)33:1L.49:IPNR;1-   
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JT Journal of structural engineering
DA DEC 01 2000 v 126 n 12
PG 1451   
AU Rhim, Hong C.   
AU Buyukozturk, Oral   
TI Wideband Microwave Imaging of Concrete for Nondestructive Testing.   
SI 0733-9445(20001201)126:12L.1451:WMIC;1-   
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JT Applied physics letters.
DA NOV 27 2000 v 77 n 22
PG 3544   
AU Passow, T.   
AU Heinke, H.   
AU Hommel, D.   
TI Nondestructive detection of stacking faults for optimization of CdSe/ZnSe   
   quantum-dot structures.   
SU SI 0003-6951(20001127)77:22L.3544:NDFO;1-   
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JT Journal of nondestructive evaluation.
DA MAR 01 1999 v 18 n 1
PG 3   
AU Auld, B.A.   
AU Moulder, J.C.   
TI Review of Advances in Quantitative Eddy Current Nondestructive Evaluation.  
SI 0195-9298(19990301)18:1L.3:RAQE;1-   
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JT Industrial laboratory :  diagnostics of material
DA APR 01 2000 v 66 n 4
PG 274   
AU Ivanov, V. I.   
AU Vlasov, I. E.   
TI Acoustic-Emission Monitoring in the Operational Safety of Industrial Objects
   (Proceedings of the 15th Russian Research Conference "Nondestructive   
   Evaluation and Diagnostics").   
SI 0019-8447(20000401)66:4L.274:AMO;1-   
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JT Journal of nondestructive evaluation.
DA MAR 01 1999 v 18 n 1
PG 3   
AU Auld, B.A.   
AU Moulder, J.C.   
TI Review of Advances in Quantitative Eddy Current Nondestructive Evaluation.  
SI 0195-9298(19990301)18:1L.3:RAQE;1-   
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JT Measurement techniques.
DA JUN 01 2000 v 43 n 6
PG 522   
AU Manokhin, A.E.   
AU Gerasimov, N.B.   
TI Equivalent Electrical Method of Determining the Amplitude-Frequency   
   Characteristics of Eddy-Current Vibratory Displacement Sensors.   
SI 0543-1972(20000601)43:6L.522:EEMD;1-   
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JT Macromolecular rapid communications.
DA SEP 11 2000 v 21 n 13
PG 894   
AU Reinecke, H.   
AU Sacristan, J.   
AU Yarwood, J.   
TI Depth profiling of modified PVC surfaces using confocal Raman   
   microspectroscopy.   
SU Communication: 4-aminothiophenol modified PVC films are investigated by
   confocal Raman microsscopy (CRM). This nondestructive technique allows the
   characterization of interfaces up to 50 microns thick with a resolution of
   1.4 micrometer. The accuracy of CRM is demonstrated by comparing mean
   degrees of modification caculated from the depth profiles with values
   obtained by transmission FTIR spectroscopy. The Raman spectra of
   4-aminothiophenol obtained at 1.4 micrometer depth in£
SU tervals through a 35 micrometer PVC film are shown in the Figure.
SI 1022-1336(20000911)21:13L.894:DPMP;1-   
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