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TOC - Feb 2001 : NDT plus

A Manually selection by use of the Keyword alert of 'non-destructive testing', 'nondestructive testing' and 'eddy current'
                                  
JT Applied physics letters.
DA JAN 15 2001 v 78 n 3
PG 383   
AU Lantz, M. A.   
AU Jarvis, S. P.   
AU Tokumoto, H.   
TI High resolution eddy current microscopy.   
SI 0003-6951(20010115)78:3L.383:HREC;1-   
AV Article availability and price:                     
$  29.00 Total  =  10.00 Service +  15.00 Copyright +  4.00 Fax Surch.         
>>                 UnCover #:  251,134,075,230          
  
                            
JT Acta horticulturae.
DA MAR 01 2000 n 517
PG 413   
AU Inoue, H.   
AU Tateishi, A.   
TI The Application of Non-Destructive Handy Hardiness Meter for Assessment of  
   Avocado Fruit Firmness.   
SI 0567-7572(20000301)517L.413:ANHH;1-   
AV Article availability and price:                     
$  17.00 Total  =  10.00 Service +   3.00 Copyright +  4.00 Fax Surch.         
>>                 UnCover #:  251,134,122,225          
  
JT Acta horticulturae.
DA MAR 01 2000 n 517
PG 435   
AU Peirs, A.   
AU Lammertyn, J.   
AU De Baerdemaeker, J.   
TI Non-Destructive Quality Measurements of Apples by Means of NIR-Spectroscopy.
SI 0567-7572(20000301)517L.435:NQMA;1-   
AV Article availability and price:                     
$  17.00 Total  =  10.00 Service +   3.00 Copyright +  4.00 Fax Surch.         
>>                 UnCover #:  251,134,123,002          
  
JT Acta horticulturae.
DA MAR 01 2000 n 517
PG 441   
AU Moons, E.   
AU Sinnaeve, G.   
AU Dardenne, P.   
TI Non-Destructive Visible and NIR Spectroscopy Measurement for the   
   Determination of Apple Internal Quality.   
SI 0567-7572(20000301)517L.441:NVNS;1-   
AV Article availability and price:                     
$  17.00 Total  =  10.00 Service +   3.00 Copyright +  4.00 Fax Surch.         
>>                 UnCover #:  251,134,123,014          
  
JT Applied physics letters.
DA JAN 01 2001 v 78 n 1
PG 129   
AU Watson, C. C.   
AU Chan, Winston K.   
TI High-spatial-resolution semiconductor characterization using a microwave   
   eddy current probe.   
SI 0003-6951(20010101)78:1L.129:HSC;1-   
AV Article availability and price:                     
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>>                 UnCover #:  251,133,248,224          
     
  
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