JT Thin solid films.
DA APR 02 2001 v 385 n 1 / 2
PG 22
AU Rangarajan, S.
AU King, A. H.
TI Non-destructive evaluation of delamination in ceramic thin films on metal
substrates by scanning electron microscopy.
SI 0040-6090(20010402)385:1:2L.22:NEDC;1-
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JT Advanced materials & processes.
DA APR 01 2001 v 159 n 4
PG 48
TI Quality Expo International 2001.
SU Companies exhibiting at QEI 2001 (24-26 April, Rosemont, Ill.) are listed.
Among them are specialists in mechanical testing, metallography, and
nondestructive testing. SI 0882-7958(20010401)159:4L.48:QEI2;1-
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JT Iee proceedings, optoelectronics.
DA FEB 01 2001 v 148 n 1
PG 69
AU Constant, S. B.
AU Sale, T. E.
AU Hosea, T. J. C.
TI Nondestructive spectroscopic characterisation of visible resonant cavity
light emitting diode structures.
SI 1350-2433(20010201)148:1L.69:NSCV;1-
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>> UnCover #: 251,136,113,179
JT Applied optics.
DA APR 20 2001 v 40 n 12
PG 1897
AU Wu, Zhouling
AU Stolz, Christopher J.
AU Zhao, Qiang
TI Damage threshold prediction of hafnia-silica multilayer coatings by
nondestructive evaluation of fluence-limiting defects.
SI 0003-6935(20010420)40:12L.1897:DTPM;1-
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>> UnCover #: 251,136,119,002
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