JT Semiconductor science and technology. DA MAR 01 1999 v 14 n 3 PG 305 AU Schneider, D. AU Hammer, R. AU Jurisch, M. TI Erratum: Non-destructive testing of damage layers in GaAs wafers by surface acoustic waves. SI 0268-1242(19990301)14:3L.305:ENTD;1- AV Article availability and price: $ 33.75 Total = 10.00 Service + 19.75 Copyright + 4.00 Fax Surch. >> UnCover #: 251,109,042,117 JT Nuclear instruments & methods in physics researc DA 1999 v 422 n 1 / 3 PG 724 AU Stepanov, V. E. AU Ivanov, O. P. AU Urutskoev, L. I. TI Application of gamma-ray imager for non-destructive testing. SI 0168-9002(1999)422:1:3L.724:AGIN;1- AV Article availability and price: $ 34.00 Total = 10.00 Service + 20.00 Copyright + 4.00 Fax Surch. >> UnCover #: 251,109,085,193 JT Nuclear instruments & methods in physics researc DA 1999 v 422 n 1 / 3 PG 909 AU Bronnikov, A.V. AU Killian, D. TI Cone-beam tomography system used for non-destructive evaluation of critical components in power generation. SI 0168-9002(1999)422:1:3L.909:CTSU;1- AV Article availability and price: $ 34.00 Total = 10.00 Service + 20.00 Copyright + 4.00 Fax Surch. >> UnCover #: 251,109,088,116 JT Industrial laboratory : diagnostics of material DA JUN 01 1998 v 64 n 6 PG 415 AU Gabidullin, M. G. AU Kamaletdinov, V. S. AU Kamaletdinov, D. V. TI A Testing Unit for Nondestructive Monitoring of Physicomechanical Properties of Building Materials and Reinforced-Concrete Products. SI 0019-8447(19980601)64:6L.415:TUNM;1- AV Article availability and price: $ 36.00 Total = 10.00 Service + 22.00 Copyright + 4.00 Fax Surch. >> UnCover #: 251,109,012,138 JT JOM : the journal of the Minerals, Metals & Mat DA MAR 01 1999 v 51 n 3 PG 33 AU Srivatsa, Arun R. TI Nondestructive Evaluation Techniques in Semiconductor Wafer Fabrication. SI 0148-6608(19990301)51:3L.33:NETS;1- AV Article availability and price: $ 21.25 Total = 10.00 Service + 7.25 Copyright + 4.00 Fax Surch. >> UnCover #: 251,109,021,232 JT Electrochemical and solid-state letters DA APR 01 1999 v 2 n 4 PG 192 AU Dultsev, F. N. AU Baklanov, M. R. TI Nondestructive Determination of Pore-Size Distribution in Thin Films Deposited on Solid Substrates. SI 1099-0062(19990401)2:4L.192:NDPD;1- AV Article availability and price: Publisher forbids delivery of this title. >> UnCover #: 251,109,039,100 JT Nuclear instruments & methods in physics researc DA 1999 v 422 n 1 / 3 PG 846 AU Hawari, A.I. AU Wehring, B.W. AU Abdurrahman, N.M. TI Feasability of using a graphite slowing-down-time spectrometer in the nondestructive assay of nuclear materials. SI 0168-9002(1999)422:1:3L.846:FUGS;1- AV Article availability and price: $ 34.00 Total = 10.00 Service + 20.00 Copyright + 4.00 Fax Surch. >> UnCover #: 251,109,087,204 JT Forest products journal. DA JUN 01 1997 v 47 n 6 PG 53 AU Anderson, R. Bruce AU Wiedenbeck, Janice K. AU Ross, Robert J. TI Nondestructive Evaluation for Detection of Honeycomb in the Sawmill: An Economic Analysis. SI 0015-7473(19970601)47:6L.53:NEDH;1- AV Article availability and price: $ 23.75 Total = 10.00 Service + 9.75 Copyright + 4.00 Fax Surch. >> UnCover #: 251,110,045,132 JT Precision engineering. DA JAN 01 1999 v 23 n 1 PG 9 AU Goch, G. AU Schmitz, B. AU Ritter, R. TI Review of non-destructive measuring methods for the assessment of surface integrity: a survey of new measuring methods for coatings, layered structure and processed surfaces. SI 0141-6359(19990101)23:1L.9:RNMM;1- AV Article availability and price: $ 34.00 Total = 10.00 Service + 20.00 Copyright + 4.00 Fax Surch. >> UnCover #: 251,110,233,133 -- ------------------------------------------------- The REVEAL Alert service is provided by the UnCover Company. If you need further information or assistance, please phone us at 800.787.7979 (outside the US at 303.758.3030), or send e-mail to uncover@carl.org. Thank you for using REVEAL. --------------------------------------------------------------|Top|
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