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TOC - Mar 2001: Periodicals related to Ultrasonic Testing


    
         
JT Electronic packaging and production.
DA AUG 01 2000 v 40 n 8
PG 22   
TI Advanced Packaging: Laser Ultrasound Test.   
SI 0013-4945(20000801)40:8L.22:APLU;1-   
AV Article availability and price:                     
$  26.25 Total  =  10.00 Service +  12.25 Copyright +  4.00 Fax Surch.         
>>                 UnCover #:  251,134,150,064          
  
JT Journal of reinforced plastics and composites.
DA 2001 v 20 n 1
PG 76   
AU Briotti, G.   
AU Scarponi, C.   
TI Acoustic Attenuation for Ultrasonic NDI Detection of Delaminations on   
   Composite Laminates.   
SI 0731-6844(2001)20:1L.76:AAUN;1-   
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$  26.00 Total  =  10.00 Service +  12.00 Copyright +  4.00 Fax Surch.         
>>                 UnCover #:  251,134,189,177          
 
JT Measurement science & technology.
DA NOV 01 2000 v 11 n 11
PG 1570   
AU Jen, C.-K.   
AU Liaw, J-W.   
AU Yang, C-C.   
TI Ultrasonic evaluation of semi-solid metals during processing.   
SI 0957-0233(20001101)11:11L.1570:UESM;1-   
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$  44.25 Total  =  10.00 Service +  30.25 Copyright +  4.00 Fax Surch.         
>>                 UnCover #:  251,134,229,231          
  
JT Journal of applied physics.
DA FEB 15 2001 v 89 n 4
PG 2017   
AU Kushibiki, J.   
AU Miyashita, M.   
TI Quantitative evaluation of fabrication processes of proton-exchanged layers 
   in LiTaO3 optoelectronic devices by the line-focus beam ultrasonic material 
   characterization beam.   
SI 0021-8979(20010215)89:4L.2017:QEFP;1-   
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$  29.00 Total  =  10.00 Service +  15.00 Copyright +  4.00 Fax Surch.         
>>                 UnCover #:  251,135,002,075          
  
JT Journal of nondestructive evaluation.           
DA JUN 01 2000 v 19 n 2
PG 43
AU Spies, Martin
TI Computationally Efficient SH-Wave Modeling in Transversely Isotropic
   Media.
SI 0195-9298(20000601)19:2L.43:CESM;1-
>>                UnCover #:  251,135,050,238               
  
JT Journal of nondestructive evaluation.           
DA JUN 01 2000 v 19 n 2
PG 55
AU Rose, J.
AU Pelts, S.
AU Cho, Y.
TI Modeling for Flaw Sizing Potential with Guided Waves.
SI 0195-9298(20000601)19:2L.55:MFSP;1-
>>                UnCover #:  251,135,050,240               
           
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