NDTnet - July 1999, Vol.4 No.7
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Experiences with an amorphous silicon array detector in an ADR application

Th. Jaeger, U. Heike, K. Bavendiek, YXLON, Hamburg, D
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Publication Source: International Symposium on Computerized Tomography for Industrial Applications and Image Processing in Radiology March, 15 - 17, 1999 Berlin, Germany. Proceedings BB 67-CD.
Publisher: DGZfP - German Society of Non-Destructive Testing

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