NDTnet - July 1999, Vol.4 No.7
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Optimized X-ray spectra for multiphase-flow measurements

M.C. Clarijs, V.R. Bom, Z.I. Kolar, C.W.E. van Eijk, Delft University of Technology, NL;J. Frieling, A.M. Scheers, A.E.J. Reimerink, Shell, Rijswijk, NL
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Publication Source: International Symposium on Computerized Tomography for Industrial Applications and Image Processing in Radiology March, 15 - 17, 1999 Berlin, Germany. Proceedings BB 67-CD.
Publisher: DGZfP - German Society of Non-Destructive Testing

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