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Silicon Drift Detectors with On-Chip Electronics for X-Ray Spectroscopy

C. FIORINI, A. LONGONI, R. HARTMANN, P. LECHNER, AND L. STRÜDER
ABSTRACT
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Publication Source: Journal of X-Ray Science and Technology, ISSN: 0895-3996. Volume 8, Number 2, 1998. Pages: 117...
Publisher: IOS Press - Amsterdam

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